用于Functional Test 的IC测试分类,具有高产能、高稳定性。支持IC芯片在不同的温度(常温、高温、低温)环境下,进行16site 并行测试分选。可实现高精度的温度控制。
Model | EXCEED8008 | EXCEED8016 | EXCEED8008H | EXCEED8016H |
---|---|---|---|---|
Test Layout | 1/2/4/8 site | 1/2/4/8/16 site | 1/2/4 site | 1/2/4/8/16 site |
Air Supply | 0.5Mpa,450L/min | 0.5Mpa,550L/min | 0.5Mpa,450L/min | 0.5Mpa,550L/min |
Power Supply | Single phase 220V 50/60Hz 30A | Single phase 220V 50/60Hz 30A*2 | ||
Temp type | Ambient temp | High/Ambient temp | ||
Pick-up head | 2x4 module | |||
UPH | Max.13500 | |||
Index Time | Min.420ms | |||
Contact Force | 240KG (Option: 480KG) | |||
SOCKET Opening | 300mmx135 mm | |||
Dimension | 2000Lx1490Wx2200H(mm) | |||
Weight | Appox.1500kg | |||
PKG Type | QFN,QFP,BGA,LGA,PLCC,PGA, CSP,TSOP etc. | |||
PKG Size | From 2x2 to 70x70 mm | |||
Jam Rate | <1 /10000 | |||
Tray Type | Jdec | |||
Temp Range | +50degC to +100degC ±2degC; +100degC to +130degC ±3degC | |||
Num Of Sorting | Auto Tray×3,Fix Tray×3 | |||
Tester Interface | GPIB ,TTL, RS232 ,Network |